Nambari ya Sehemu :
SN74ABTH182652APM
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN TEST DEVICE 18BIT 64LQFP
Aina ya mantiki :
Scan Test Device With Transceivers And Registers
Ugavi wa Ugavi :
4.5V ~ 5.5V
Joto la Kufanya kazi :
-40°C ~ 85°C
Aina ya Kuinua :
Surface Mount
Kifurushi / Kesi :
64-LQFP
Kifurushi cha Kifaa cha Mtoaji :
64-LQFP (10x10)