Nambari ya Sehemu :
SN74LVTH182504APM
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN-TEST-DEV/XCVR 64-LQFP
Aina ya mantiki :
ABT Scan Test Device With Universal Bus Transceivers
Ugavi wa Ugavi :
2.7V ~ 3.6V
Joto la Kufanya kazi :
-40°C ~ 85°C
Aina ya Kuinua :
Surface Mount
Kifurushi / Kesi :
64-LQFP
Kifurushi cha Kifaa cha Mtoaji :
64-LQFP (10x10)