[6529pcs Hisa]
- Nambari ya Sehemu:
- SN74BCT8374ANT
- Mzalishaji:
- Texas Instruments
- Maelezo ya kina:
- IC SCAN TEST DEVICE W/FF 24-DIP.
- Manufacturer's standard lead time:
- Katika hisa
- Maisha ya rafu:
- Mwaka mmoja
- Chip Kutoka:
- Hong Kong
- RoHS:
- Njia ya malipo:
-
- Njia ya usafirishaji:
- Jamii Jamii:
- VITAMBUZI VYA Co, LTD ni Msambazaji wa Vipengele vya Elektroniki ambavyo hutoa aina za bidhaa pamoja na: Saa / Saa - Maombi Maalum, PMIC - Kamili, Madereva wa Nusu-Daraja, PMIC - Usimamizi wa Nguvu - Maalum, PMIC - Madereva wa Laser, Maingiliano - UARTs (Transformer ya Universal Asyn, Iliyoingizwa - PLDs (Kifaa cha mantiki cha Mpangil, Maelewano - Sensor, Kugusa uwezo and PMIC - Vidhibiti vya Voltage - Linear + Kubadilish ...
- Faida ya Ushindani:
- We specialize in Texas Instruments SN74BCT8374ANT electronic components. SN74BCT8374ANT can be shipped within 24 hours after order. If you have any demands for SN74BCT8374ANT, Please submit a Request for Quotation here or send us an email: rfq@key-components.com
SN74BCT8374ANT Sifa za Bidhaa
Nambari ya Sehemu :
SN74BCT8374ANT
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN TEST DEVICE W/FF 24-DIP
Mfululizo :
74BCT
Hali ya Sehemu :
Obsolete
Aina ya mantiki :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Ugavi wa Ugavi :
4.5V ~ 5.5V
Idadi ya Bits :
8
Joto la Kufanya kazi :
0°C ~ 70°C
Aina ya Kuinua :
Through Hole
Kifurushi / Kesi :
24-DIP (0.300", 7.62mm)
Kifurushi cha Kifaa cha Mtoaji :
24-PDIP
Habari mpya kabisa
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