Nambari ya Sehemu :
SN74ABT18640DL
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN-TEST-DEV/TXRX 56-SSOP
Aina ya mantiki :
Scan Test Device with Inverting Bus Transceivers
Ugavi wa Ugavi :
4.5V ~ 5.5V
Joto la Kufanya kazi :
-40°C ~ 85°C
Aina ya Kuinua :
Surface Mount
Kifurushi / Kesi :
56-BSSOP (0.295", 7.50mm Width)
Kifurushi cha Kifaa cha Mtoaji :
56-SSOP