Nambari ya Sehemu :
SN74BCT8240ADWRE4
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN TEST DEVICE BUFF 24-SOIC
Hali ya Sehemu :
Obsolete
Aina ya mantiki :
Scan Test Device with Inverting Buffers
Ugavi wa Ugavi :
4.5V ~ 5.5V
Joto la Kufanya kazi :
0°C ~ 70°C
Aina ya Kuinua :
Surface Mount
Kifurushi / Kesi :
24-SOIC (0.295", 7.50mm Width)
Kifurushi cha Kifaa cha Mtoaji :
24-SOIC