Nambari ya Sehemu :
8V182512IDGGREP
Mzalishaji :
Texas Instruments
Maelezo :
IC ABT SCAN TEST DEV3.3V 64TSSOP
Aina ya mantiki :
ABT Scan Test Device With Universal Bus Transceivers
Ugavi wa Ugavi :
2.7V ~ 3.6V
Joto la Kufanya kazi :
-40°C ~ 85°C
Aina ya Kuinua :
Surface Mount
Kifurushi / Kesi :
64-TFSOP (0.240", 6.10mm Width)
Kifurushi cha Kifaa cha Mtoaji :
64-TSSOP