Texas Instruments - SN74BCT8373ADWRE4

KEY Part #: K1320206

[6496pcs Hisa]


    Nambari ya Sehemu:
    SN74BCT8373ADWRE4
    Mzalishaji:
    Texas Instruments
    Maelezo ya kina:
    IC SCAN TEST DEVICE LATCH 24SOIC.
    Manufacturer's standard lead time:
    Katika hisa
    Maisha ya rafu:
    Mwaka mmoja
    Chip Kutoka:
    Hong Kong
    RoHS:
    Njia ya malipo:
    Njia ya usafirishaji:
    Jamii Jamii:
    VITAMBUZI VYA Co, LTD ni Msambazaji wa Vipengele vya Elektroniki ambavyo hutoa aina za bidhaa pamoja na: Saa / Saa - Batri za IC, Maingiliano - vichungi - Inayotumika, PMIC - Watawala wa Nguvu Zaidi ya Ethernet (PoE), Kumbukumbu, Saa / Saa - Clocks halisi za saa, Saa / Majira - Muda uliopangwa na Oscillators, PMIC - Vidhibiti vya Voltage - Linear and Mantiki - Gates na Inverters - Kazi nyingi, Kudhib ...
    Faida ya Ushindani:
    We specialize in Texas Instruments SN74BCT8373ADWRE4 electronic components. SN74BCT8373ADWRE4 can be shipped within 24 hours after order. If you have any demands for SN74BCT8373ADWRE4, Please submit a Request for Quotation here or send us an email:
    GB-T-27922
    ISO-9001-2015
    ISO-13485
    ISO-14001
    ISO-28000-2007
    ISO-45001-2018

    SN74BCT8373ADWRE4 Sifa za Bidhaa

    Nambari ya Sehemu : SN74BCT8373ADWRE4
    Mzalishaji : Texas Instruments
    Maelezo : IC SCAN TEST DEVICE LATCH 24SOIC
    Mfululizo : 74BCT
    Hali ya Sehemu : Obsolete
    Aina ya mantiki : Scan Test Device with D-Type Latches
    Ugavi wa Ugavi : 4.5V ~ 5.5V
    Idadi ya Bits : 8
    Joto la Kufanya kazi : 0°C ~ 70°C
    Aina ya Kuinua : Surface Mount
    Kifurushi / Kesi : 24-SOIC (0.295", 7.50mm Width)
    Kifurushi cha Kifaa cha Mtoaji : 24-SOIC