Nambari ya Sehemu :
SN74BCT8245ANT
Mzalishaji :
Texas Instruments
Maelezo :
IC SCAN TEST DEVICE TXRX 24-DIP
Hali ya Sehemu :
Obsolete
Aina ya mantiki :
Scan Test Device with Bus Transceivers
Ugavi wa Ugavi :
4.5V ~ 5.5V
Joto la Kufanya kazi :
0°C ~ 70°C
Aina ya Kuinua :
Through Hole
Kifurushi / Kesi :
24-DIP (0.300", 7.62mm)
Kifurushi cha Kifaa cha Mtoaji :
24-PDIP