Nambari ya Sehemu :
8V18646AIPMREP
Mzalishaji :
Texas Instruments
Maelezo :
IC ABT SCAN TEST DEV 3.3V 64LQFP
Mfululizo :
SCOPE™, Widebus™
Hali ya Sehemu :
Obsolete
Maombi :
Circuit Board Testing
Maingiliano :
4-Wire Test Access Port (TAP)
Voltage - Ugavi :
2.7V ~ 3.6V
Kifurushi / Kesi :
64-LQFP
Kifurushi cha Kifaa cha Mtoaji :
64-LQFP (10x10)
Aina ya Kuinua :
Surface Mount